News from materialography:
Discover the options for FIB-SEM microscopy at Quality Analysis
Profit from the unbeatable combination of a high-resolution field-emission scanning electron microscope with the processing functions of a focused ion beam and a femtosecond laser. FIB-SEM technology enables us to analyse your samples down to the nanometre level.
In the following, you will find a small excerpt of the numerous analysis options using FIB-SEM:
- Analysis of layer structures and chemical analysis of the individual layers
- High-resolution cross-sectional analyses in the nanometre range
- 3D tomography of complex structures by means of serial sections
- Analysis of microstructures
- Investigation and analysis of defects in electronic assemblies
- Analysis of the individual components in a fuel cell or a lithium-ion battery cell
What can we analyse for you? Feel free to contact us.
