Materialography

Destructive Analysis for developing constructive
processes and products

As a destructive materials test, materialography is always used in industry and research when quantitative and qualitative statements on material composition are needed in which the relationships between the chemical composition, crystalline structure and technological composition can be recorded.

The analyses are carried out primarily in the evaluation of production processes, damage prevention, cause analysis in the event of a defect and for process optimization in product development. They also aid in identifying causes in the case that a component fail.

Our modern analytical procedures include highly precise metallographic sample preparation, crystalline structure analysis, light microscope analyses as well as layer thickness measurements and weld seam analyses, chemical elementary analyses, RAMAN- and FT-IR-spectroscopy as well as hardness testing.

Project Path

Step 1
Identification of actual state

After precisely recording and assessing the actual state, we set down the analysis strategy in dialogue with you.

Multi-shift operation assures an efficient and flexible execution of the entire project sequence.

Our service: On request, our fleet will pick up your components and return them.

Step 2
Analytical Services

  • Metallographic Sample and Microsection Preparation
  • Light microscopy
    • Back
    • Layer Thickness Measurement
    • Defect Analysis: cracks, break analysis, anomalies in the component, material accumulation
    • Weld Seam Inspection
    • Soldering Point Analysis
    • Microstructure Examination
  • Scanning-Electron-Microscopy
    • Back
    • Chemical Elementary Analysis (EDX-Analysis)
    • Surface-sensitive Analysis (Topography)
    • Joint-Sensitive Analysis
    • Fully Automatic Particle Analysis SmartPI
  • RAMAN-Spectroscopy
    • Back
    • Organic and inorganic material analysis
  • FT-IR-Spectroscopy
  • Spark-Optical-Emission Spectroscopy (OES)
  • Hardness Testing
  • Boro- & Videoscopy

Step 3
Documentation

Perfect data in combination with excellent analytics build the foundation of our documentation.

The results are documented in such a way that you can draw the right conclusions for your quality assurance. As needed, we will consult and support you: via telephone, web meeting, remote support or in personal conversation.

The analysis reports can be added directly into your own process documentation.


Needed Analytical Service not found?
Contact us!

Technical Equipment

To provide the best solution for our customers we have a considerable range of analytic systems at our disposal. Mostly, the combination of different systems yield to definitive results. The experience and expertise of our experts lead to your success.

In our large metallographic laboratory, we can carry out sample preparations for components up to 600 x 600 x 1200 mm; all conventional procedures are available.

All of our high-tech-equipment for joint analysis, damage analysis and/or cause research, hardness testing and chemical elementary analysis (EDX) is state of the art.

Sample Preparation

Cutting

Special cutting systems for precise cuts

Max. cutting range (mm):

L = 600
B = 600
H = 1200

Systems:

  • Klaeger Bitron 350
  • Mössner Rekord
  • Struers Secotom-15
  • Struers Discotom-5
  • Diadisc 5200
Mounting

Perfect Combination of warm and cold mounting processes (electrically conductive / electrically non-conductive)

Systems:

  • Struers CitoPress 1
Grinding and Polishing

Typical fully automatic grinding and polishing process

Systems:

  • Struers Tegramin-30 mit 6-fach Dispersionszumischung
Automatic Cleaning

Fully automatic process for an efficient and resource sparing cleaning

Systems:

  • Struers Lavamin
  • US-Kleinstbecken
Electrolytic Preparation

Manual and electrolytic polishing, as well as, etching with acid, bases and alkalis

Systems:

  • Struers Lectropol-5
  • QA-special equipment
Coating

Layer thickness up to 2nm with platinum and carbon

Systems:

  • Leica EM ACE600 Sputter

Analysis Systems

ZEISS Supra 40 VP

ZEISS Supra 40 VP

Magnification
40 - 200000
Specific spatial resolution
  • 2,0 nm at 30kV in high vacuum
  • 1,0 nm at 15 kV in high vacuum
  • 1,9 nm at 1 kV in high vacuum
Vacuum process
  • High vacuum
  • Variable low vacuum up to 2 PA to 133 PA
Generation electron beam
Field emission (Voltage stability < 0,2%/h)
Sample size (mm)
L = 100, W = 100, H = 35
Sample stage
  • Fully automatic stage with 5-axis
  • Eucentric tilt
  • Movement range: x = ± 65 mm; y = ± 65 mm; z = 50 mm
Sample chamber (mm)
Inner diameter = 420
Chamber height = 330
Sample weight (kg)
0,5
Detectors
  • SE-Detector (secondary electron in HV)
  • VPSE-Detector (secondary electron in VV)
  • BSD-Detector 5-Quadranten (back scattered electrons up to 1 Kea)
  • EDX-Detector [127eV] (X-ray quanta) Bruker Quantax 200
Software
ZEISS SEM
Accelerating voltage
Up to 30 kV
Special features
  • High flexibility due to jet stream of 12 pA to 100 nA
  • Universal use with Smart SEM
ZEISS Evo MA 25

ZEISS Evo MA 25

Magnification
40 - 75000
Specific spatial resolution
  • 3,0 nm at 30kV in high vacuum
  • 10,0 nm at 3 kV in high vacuum
Vacuum process
  • High vacuum
  • Variable low vacuum up to 400 Pa
Generation electron beam
Tungsten cathode
Sample size (mm)
L = 100; W = 100; H = 35
Sample stage
  • Fully automatic stage with 5-axis
  • Eucentric tilt
  • Movement range: x = ± 65 mm; y = ± 65 mm; z = 50 mm
Sample chamber (mm)
Inner diameter = 420
Chamber height = 330
Sample weight (kg)
1
Detectors
  • SE-detector (secondary electron in HV)
  • VPSE-detector (secondary electron in VV)
  • BSD-detector 5-quadrants (back scattered electrons up to 1 Kea)
  • EDX-detector [129eV] (X-ray quanta) Bruker Quantax 200
Software
ZEISS SEM and Smart PI
Accelerating voltage
Up to 30 kV
Special features
  • Fully automatic particle analysis with Smart PI [5-fivefold sample holder]
  • Universal use with Smart SEM
ZEISS Axio Imager .M2m

ZEISS Axio Imager .M2m

Quantity
2
Object lens
6-fold motorized Object lens revolver
  • EC Epiplan Neofluar 1,25x/0,03 M27
  • EC Epiplan Neofluar 2,5x/0,06 M27
  • EC Epiplan-Neofluar 5x/0,13 HD DIC M27
  • EC Epiplan-Neofluar 10x/0,25 HD DIC M27
  • EC Epiplan-Neofluar 20x/0,50 HD DIC M27
  • EC Epiplan-Neofluar 50x/0,80 HD DIC M27
  • EC Epiplan-Neofluar 100x/0,90 HD DIC M27
Equipment
Fully automatic, reproducible settings
Z-axis
Motorized, Z-stack
Reflector
6-fach motorisierter Reflektorrevolver
  • bright field
  • dark field
  • DIC / POL ACR PC Shift free
  • mot. aperture shutter, indicator field aperture
  • mot. aperture
Polarization
Reflector module polarisation ACR P&C for transmitted light
Movement range (mm)
1x with 75 x 50
1x with 230 x 160
mot. electr. coaxial drive for XY-stage and scanning stage
Camera
AxioCam ICc 5
Software
AxioVision SE64 Materialpaket Standard, MosaiX
Zeiss SteREO Discovery V12

Zeiss SteREO Discovery V12

Object lens
Object lens Planapo S 1,0x FWD 81 mm
Equipment
Z-stack
Z-axis
motorized, Z-stack
Illumination
VisiLED ring light for bright field
Object lens stage - movement range (mm)
1x with 150 x 100 movement range
mot. electr. coaxial drive for XY-stage and scanning stage
Camera
AxioCam 105 color
Software
AxioVision SE64 material package standard, MosaiX
ZEISS SmartZoom
Source: Carl Zeiss AG

ZEISS SmartZoom

Object lens
Object lens PlanApo D 0,5x/0,03 FWD 78 mm
Object lens PlanApo D 1,6x/0,1 FWD 36
Object lens PlanApo D 5x/0,3 FWD 30
Equipment
Z-stack
Z-axis
motorized, Z-stack
Object lens stage - movement range (mm)
1x with 130 x 100 movement range
mot. electr. coaxial drive for XY-stage and scanning stage
Camera
Smartzoom 5 optical engine
Software
ZEISS Smartzoom
Struers Welding Expert HR II (E) 50x

Struers Welding Expert HR II (E) 50x

Illumination
LED ring light
Object lens field (mm)
4,5 to 80 at magnification
2,5x to 50x
Camera
Digital megapixel resolution with motorized zoom
Software
Welding Expert full version
ZEISS AxioLab.A1 MAT HAL
Source: Carl Zeiss AG

ZEISS AxioLab.A1 MAT HAL

Object lens
5-fold motorized object lens revolver
  • EC Epiplan-Neofluar 5x/0,13 HD DIC M27
  • EC Epiplan-Neofluar 10x/0,20 HD DIC M27
  • EC Epiplan-Neofluar 20x/0,40 HD DIC M27
  • EC Epiplan-Neofluar 50x/0,70 HD DIC M27
Equipment
Manually controlled
Z-axis
Z-drive manually
Reflector
4-fold motorized object lens revolver
  • bright field ACR P&C for transmitted light microscope
  • dark field ACR P&C for transmitted light microscope
Illumination
Halogen
Object lens stage - movement range (mm)
1x with 75 x 30 movement range
Manual XY-stage
Camera
AxioCam ICc 1 Rev.4
Renishaw RAMAN inVia REFLEX

Renishaw RAMAN inVia REFLEX

Spectral resolution (cm-1)
< 1 - 2
Spectral stability (cm-1)
< ± 0,05 over 7,5 h
Sensitivity
< 100 sec. --> S/N > 3
Laser point diameter (µm)
1 - 300
Laser intensity (%)
0,00005 - 100
Objet lens
N PLAN x5; NA 0,12; WD 14
N PLAN x20; NA 0,40; WD 1,15
N PLAN x50; NA 0,7; WD 0,37
Laser class
1
Sample stage (mm)
112 x 76 movement range
Sample height (mm)
34
Sample weight (KG)
2
Detectors
CCD Array Detector 1024x256 pixel, cooled
Software
WIRE 4.2 and special modules
Spectra
S.T. Japan Complete Collection +
incl. Minerals, inorganic materials and gemstones
QA-specific spectra
Laser
532 nm Nd:YAG-Laser, 50 mW - Scatter with 1800 lines/mm
785 nm diode laser, 300 mW - Scatter with 1200 lines/mm
457 nm solid state laser, 25 mW - Scatter with 2400 lines/mm
Special featues
  • 3 laser wavelengths
  • Auto focus function
Bruker Lumos FT-IR-Microscope

Bruker Lumos FT-IR-Microscope

Physical basis
Transmission and reflexion
Supplement
ATR = attenuated total reflection
Spectral resolution (cm-1)
< 2
Spectral range (cm-1)
650 - 6000
Spectral stability (cm-1)
< ± 0,05 over 7,5 h
Sensitivity
< 100 sec. --> S/N > 3
Laser point diameter (µm)
1 - 300
Laser intensity (%)
0,00005 - 100
Object lens
N PLAN x5; NA 0,12; WD 14
N PLAN x20; NA 0,40; WD 1,15
N PLAN x50; NA 0,7; WD 0,37
Illumination
IR and VIS-illumination
Sample stage (mm)
75 x 50 movement range
Detectors
MCT-detector (Mercury-Cadmium-Tellurid), liquid-cooled nitrogen
Software
OPUS/IR+; OPUS/3D+; OPUS/Search, OPUS/Structure and more
Spectra
BRUKER Basis S.T.Japan ATR-FTIR complete + QA-specific spectra
Special features
  • IR and VIS-mode as well as ATR-mode
STRUERS DuraScan-70

STRUERS DuraScan-70

Test load range (gf)
10 - 10000
Test head
6-fold motorized
Z-axis
Motorized, sample height 260 mm
Sample stage (mm)
Linear stage 200 x 120
Movement range 140 x 140
Illumination
LED
Camera
High resolution evaluation camera
Overview camera (FOV 52 x 40)
Test method
Vickers with MPA-certificate
Object lens
Object lens 10x
Object lens 40x
Function
Fully automatic hardness testers
Software
EMCO/STRUERS special software
AMETEK SPECTRO SpectromaxX, Version M

AMETEK SPECTRO SpectromaxX, Version M

Functional principle
Spark-Optical Emission Spectrometry (OES-CCD-Spectrometer)
Re-Calibration (method)
ICALISIERUNG
Process gas
Argon 5.0
Sample size (mm)
Min. of 3mm
Analysis conditions
From 140 nm analysis of nitrogen (N2)
Process
Fingerprint technology to capture the whole spectrum with CCD-optics
Spark excitation
Plasma generator
Matrices
Fe / Al / Cu / Mg / Zn / Ni / Co / Ti / Pb / Sn
STORZ TECHNO PACK Xe & Techno Pack II

STORZ TECHNO PACK Xe & Techno Pack II

Endoscopy
CCD-/CMOS-technology
CLICK4MOVE deflection 4x 170° possible
Video endoscopy
2m x ᴓ = 4 mm, PAL, industrial endoscope with a outer-ᴓ = 4,2 mm,
perspective = 0°, depth of focus = 20 - 200 mm,
interchangeable object lens = 0°
Interchangeable object lens
interchangeable object lens = 0° for perspective = 0° and und view angle = 80°, colour code = yellow ,depth of focus = 7 - 40 mm
Camera
Camera with fibre object TELECAM, single-chip-camera head, PAL, sterilized by gas, with integrated par focal zoom object lens , f = 25 - 50 mm
Optical fibre
Glass fibre optical fibre = 180 cm, outer-ᴓ = 6,2 mm, active-ᴓ = 3,4 mm
Borescope
Semi-rigid borescope, focusable, perspective = 0°, view angle = 70°, outer-ᴓ = 1,2 mm, lengths = 100 mm, fibre optic image guide
Diverse rigid borescope with HOPKINS rod lenses optic, perspective = 30° and 70°, view angle = 90° and 55°, outer-ᴓ = 2,9 and 6,5 mm, lengths 170 and 320 mm