Technical Cleanliness Verification

Particulate and residual dirt analysis

Functionally relevant parts of components and systems are often located on the insides of pipes, channels, housings, tanks, pumps, valves or similar components. If fluids are used here, particles can be transported to sensitive locations and can lead over the long term to loss of function and even to damage to the system.

Technical cleanliness verification can be assessed through analysis especially in the initial sampling evaluation, re-qualification, as well as the, input and output controls for monitoring the manufacturing process.

Our accredited testing laboratory conforms to DIN EN ISO/IEC 17025, a clean room in ISO class 8, is equipped for all conventional extraction procedures for both the smallest components as well as for large assembly groups (see Technical Equipment). By using light and scanning electron microscopy as well as RAMAN- and FT-IR-spectroscopy, the particular pollution will be detected and identified in the most precise manner. We also analyze particle traps from ambient monitoring.

The standard VDA Bd. 19/19.1 and VDA Bd. 19.2, as well as, ISO 16232 are the basis for the cleanliness tests. All customer and works norms will be adapted on request.

Project Path

Step 1
Identification of the
Actual State

After precisely recording the actual status based on drawings and the relevant norms, we will decide on the testing methods and qualification analysis in consultation with you and generate the test specification.


Step 2
Analytical Services

Extraction Procedures:

  • Rinsing / Spraying
  • Ultrasound
  • Oil- /Fluid Analysis
  • Particle Traps for Ambient Monitoring

 

Analytic Procedures:

  • Filtration
  • Gravimetry
  • Light Microscope Analysis
  • Chemical Elementary Analysis (EDX)
  • RAMAN-Spectroscopy
  • FT-IR-Spectroscopy

Step 3
Documentation

Perfect data in combination with excellent analytics build the foundation of our documentation.

The results are documented in such a way that you can draw the right conclusions for your quality assurance. As needed, we will consult and support you: via telephone, web meeting, remote support or in personal conversation.

The analysis reports can be added directly into your own process documentation.


Needed Analytical Service not found?
Contact us!

Technical Equipment

Both small components as well as components up to a weight of 100 kg and a size of W= 1700, D = 745, H = 905 can be analyzed. We have a large number and great variety of rinsing cabinets available. Therefore, we can offer all conventional extraction procedures like rinsing, spraying or ultrasound.

Filtration and gravimetric determination of residual dirt quantity as well as comprehensive particle analysis using light and scanning electron microscopy as well as RAMAN- and FT-IR-spectroscopy serve to provide highly precise identification and detection of particular pollution.

With the broad variety of analysis systems, we can detect and analyze organic and inorganic particles.

Component size

Max. measuring range (mm)
Length = 1700
Width = 745
Height = 905

Component weight

Max. 100 kg

Components

Single components and assemblies

Liquids

Solvents and aqueous basis, as well as, demineralised water

Standards
  • Laboratory certified according to VDA 19/19.1 and ISO 16232
  • Application of the following standards: 4405, 4406 and 4407, as well as, VDA 19.2
  • Approval of OEM´s and application of almost all specific customer and works norms from different industry sectors

Extraction systems

ACM 17

ACM 17

Quantity
3
Max. bowl size Ø (mm)
500
Max. component weight (kg)
5
Volume flow (ml/min)
50 - 1500
Nozzle system
Variable nozzle adaptable
Ultrasonic power (Watt/l), frequency 40 kHz
100-200
System filter absolute (µm)
0,2
Return line filter absolute (µm)
0,5
Filter cascade
3
Rius Single

Rius Single

Quantity
1
Max. bowl size Ø (mm)
L = 1100, W = 800, H = 650
Max. component weight (kg)
15
Volume flow (ml/min)
50 - 3000
Nozzle system
Variable nozzle adaptable
Ultrasonic power (Watt/l), frequency 40 kHz
Without
System filter absolute (µm)
0,2
Return line filter absolute (µm)
5
Filter cascade
3
Rius QA-Custom made

Rius QA-Custom made

Quantity
1
Max. bowl size Ø (mm)
L = 1700, W = 745, H = 905
Max. component weight (kg)
30
Volume flow (ml/min)
50 - 3000
Nozzle system
Variable nozzle adaptable
Ultrasonic power (Watt/l), frequency 40 kHz
Without
System filter absolute (µm)
0,65
Return line filter absolute (µm)
0,65
Filter cascade
3
Special features
Handling system
WALTER Ultraschall QA-Custom made

WALTER Ultraschall QA-Custom made

Max. basin size Ø [mm]
L = 1100, B = 580, H = 400
Max. component weight (kg)
100
Capacity (l)
360
Ultrasonic power (Watt/l), frequency 40 kHz
8000/4000 eff.
Regulation ultrasonic power
9-stepped, digital
Volume flow (ml/min)
50 - 3000
Nozzle system
Variable nozzle adaptable
System filter absolute (µm)
1
Return line filter absolute (µm)
1
Filter cascade
3
Special features
Ultrasonic and splatter cleaning

Analysis Systems

Sartorius Waage CPA225D-VF3837

Sartorius Waage CPA225D-VF3837

Weighing capacity (g)
10
Readability (mg)
0,01
Resolution (mg)
0,01
Reproducibility (mg)
± 0,02
Linearity (mg)
± 0,03
Special features
  • Insulating table platform with level control system
  • Automatic internal adjustment by temperature changes >2°K
  • Faraday cage in the weighing area
Jomesa

Jomesa

Quantity
5
Object lens
Diverse magnification
Resolution (µm)
X = 6,2 / Y = 6,2
Illumination
LED ring light
Illumination technique
Linearly polarized reflected light microscope
Analysis diameter (mm)
44
Analysis method
Fully automatic
Reevaluation
manually
Special features
  • Polarizer detection: metallic - non-metallic
  • Particle detection from a size of 25 µm on
ZEISS AxioZoom V16

ZEISS AxioZoom V16

Object lens
Z = 0,5x/0,125; Z = 1,5x/0,37
Object lens control
Object lens revolver
Illumination
LED ring light
Illumination technique
Linearly polarized reflected light microscope
Special features
  • Polarizer detection: metallic - non-metallic
  • Particle detection from a size of 10 µm on
ZEISS Evo MA 25

ZEISS Evo MA 25

Magnification
40 - 75000
Specific spatial resolution
  • 3,0 nm at 30kV in high vacuum
  • 10,0 nm at 3 kV in high vacuum
Vacuum process
  • High vacuum
  • Variable low vacuum up to 400 Pa
Generation electron beam
Tungsten cathode
Sample size (mm)
L = 100; B = 100; H = 35
Sample stage
  • Fully automatic stage with 5-axis
  • Eucentric tilt
  • Movement range: x = ± 65 mm; y = ± 65 mm; z = 50 mm
Sample chamber (mm)
Inner diameter = 420
Chamber height = 330
Sample weight (kg)
1
Detectors
  • SE-Detekcor [secondary electron in HV)
  • VPSE-Detector (secondary electron in VV)
  • BSD-Detector 5-Quadranten (back scattered electrons up to 1 Kea)
  • EDX-Detector [129eV] (X-ray quanta) Bruker Quantax 200
Software
ZEISS SEM und Smart PI
Accelerating voltage
Up to 30 kV
Special features
  • Fully automatic particle analysis with Smart PI (5-fivefold sample holder)]
  • Universal use with Smart SEM
Renishaw RAMAN inVia REFLEX

Renishaw RAMAN inVia REFLEX

Spectral resolution (cm-1)
< 1 - 2
Spectral stability (cm-1)
< ± 0,05 over 7,5 h
Sensivity
< 100 sec. --> S/N > 3
Laser point diameter (µm)
1 - 300
Laser intensity (%)
0,00005 - 100
Object lens
N PLAN x5; NA 0,12; WD 14
N PLAN x20; NA 0,40; WD 1,15
N PLAN x50; NA 0,7; WD 0,37
Laser class
1
Sample stage (mm)
112 x 76 movement range
Sample height (mm)
34
Sample weight (KG)
2
Detectors
CCD Array Detector 1024x256 pixel, cooled
Software
WIRE 4.2 and special modules
Spectra
S.T. Japan Complete Collection +
incl. Minerals, inorganic materials and gemstones
QA-spezific spectra
Laser
532 nm Nd:YAG-Laser, 50 mW - Scatter with 1800 lines/mm
785 nm diode laser, 300 mW - Scatter with 1200 lines/mm
457 nm solid state laser, 25 mW - Scatter with 2400 lines/mm
Special features
  • 3 laser wavelengths
  • Auto focus function
Bruker Lumos FT-IR-Mikroskop

Bruker Lumos FT-IR-Mikroskop

Physical basis
Transmission and reflexion
Supplement
ATR = attenuated total reflection
Spectral resolution (cm-1)
< 2
Spectral range (cm-1)
650 - 6000
Spectral stability (cm-1)
< ± 0,05 over 7,5h
Sensitivity
< 100 sec. --> S/N > 3
Laser point diameter (µm)
1 - 300
Laser intensity (%)
0,00005 - 100
Object lens
N PLAN x5; NA 0,12; WD 14
N PLAN x20; NA 0,40; WD 1,15
N PLAN x50; NA 0,7; WD 0,37
Illumination
IR and VIS-illumination
Sample stage (mm)
75 x 50 movement range
Detectors
MCT-detector (Mercury-Cadmium-Tellurid), liquid-cooled azote
Software
OPUS/IR+; OPUS/3D+; OPUS/Search, OPUS/Structure and more
Spectra
BRUKER Basis
S.T.Japan ATR-FTIR complete + QA-specific spectra
Special features
  • IR and VIS-mode as well as ATR-mode