Failure analysis on electronic assemblies

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Analysis of electronic assemblies

Complex components require innovative analytical techniques

We analyse and qualify your components as per the acceptance criteria for electronic assemblies (IPC-A-600) and printed circuit boards (IPC-A-610). High-performance reflected light microscopy systems, scanning electron microscopy as well as FIB-SEM analysis are used here.

The following are just some of the possible analyses we can undertake for you on electronic components:

  • Analysis of anomalies in inner printed circuit board tracks
  • Verification of flux residue
  • Evaluation of the quality of the soldering
  • Verification and analysis of electrochemical migration
  • Analysis and evaluation of assemblies after a stress test
  • Assessment of vias in multilayer printed circuit boards

Would you like to find out more about the in-depth analysis of electronic assemblies? Get in touch with our experts without obligation!

>>> Further information about analysis in electronic manufacturing

Damage to electronic assemblies
Damage to the ceramic of an electronic component

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